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Patent Searching and Data


Title:
MIRROR FRAME AND DECENTRATION MEASURING METHOD
Document Type and Number:
Japanese Patent JP2006112811
Kind Code:
A
Abstract:

To provide a decentration measuring method or the like capable of measuring a decentration amount always highly accurately, regardless of a shape error of the surface to be inspected.

This method has a first reference object position measuring process for measuring positions of three balls 100d or the like provided on a lens frame 100c; an optical element shape measuring process for measuring the shape of a prescribed surface of a lens 100; a measuring coordinate system calculation process for calculating the position of a measuring coordinate system relative to the lens frame 100c; a coordinate conversion calculation process for performing coordinate conversion of a measurement result in the optical element shape measuring process into the measuring coordinate system; a support process for supporting the lens frame 100c by a fixing frame 140 (mounting part 160); a second reference object position measuring process for measuring the position of the ball 100d of the supported lens frame 100c; a first frame body decentration amount calculation process for calculating the decentration amount to a reference axis 160a of the lens frame 100c; and an optical element decentration amount calculation process for calculating the decentration amount of the lens 100 to the reference axis 160a.


Inventors:
YAMAZAKI KAZUHIDE
Application Number:
JP2004297626A
Publication Date:
April 27, 2006
Filing Date:
October 12, 2004
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G01B21/00; G01M11/00; G02B7/04
Attorney, Agent or Firm:
Keisuke Saito