Title:
MOTION ANALYSIS METHOD, MOTION ANALYSIS DEVICE, MOTION ANALYSIS SYSTEM AND PROGRAM
Document Type and Number:
Japanese Patent JP2016055028
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a motion analysis method, a motion analysis device, a motion analysis system and a program, which can provide highly accurate motion analysis information by using output of an inertia sensor.SOLUTION: A motion analysis method of analyzing a motion, in which a measured part is at a first position at a first point of time and passes the first position at a second point of time, by using output of an inertia sensor includes: a correction step (S70) of correcting a motion parameter of the measured part, which is acquired from the output of the inertia sensor, on the basis of a difference between the first position at the first point of time and the first position at the second point of time; and an analysis step (S80) of analyzing the motion using the motion parameter after correction.SELECTED DRAWING: Figure 6
Inventors:
SHIBUYA KAZUHIRO
Application Number:
JP2014185204A
Publication Date:
April 21, 2016
Filing Date:
September 11, 2014
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
A63B69/36; A63B71/06; G16H20/30
Attorney, Agent or Firm:
Yukio Fuse
Mitsue Obuchi
Mitsue Obuchi