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Patent Searching and Data


Title:
MOVING HANDRAIL FLAW DETECTION DEVICE FOR PASSENGER CONVEYOR
Document Type and Number:
Japanese Patent JP2014012577
Kind Code:
A
Abstract:

To achieve flaw detection with high accuracy in a simple device and to improve the workability.

A moving handrail flaw detection device S for detecting a flaw in a moving handrail 2 of an escalator 100 includes: an X-ray device 4; and a moving distance measuring device 7 for measuring the travel of the X-ray device 4. The moving distance measuring device 7 includes: a speed reduction mechanism 40 for moving the X-ray device 4 at a constant speed; and a second roller 27. The moving distance measuring device 7 includes: a measuring part 7a disposed on the upside across a moving handrail 2; a driving part 7b located at the lower part; and a second latch-lock 18 connecting both parts to each other. The measuring part 7a is provided with an optical mouse 8 for measuring the travel and a first roller 14, and the driving part 7b is provided with the speed reduction mechanism 40 and the second roller 27.


Inventors:
KODAIRA NORIMI
TSUJI RYOHEI
HATAKEYAMA KAZUNORI
ONISHI TOMOJI
Application Number:
JP2012150180A
Publication Date:
January 23, 2014
Filing Date:
July 04, 2012
Export Citation:
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Assignee:
HITACHI BUILDING SYS CO LTD
International Classes:
B66B29/00; B66B31/02
Domestic Patent References:
JP2011225333A2011-11-10
JPWO2006059364A12008-06-05
JPWO2007096948A12009-07-09
Attorney, Agent or Firm:
Patent Business Corporation Takewa International Patent Office