Title:
APPARATUS AND METHOD FOR MEASURING TRANSFORMER PARAMETER
Document Type and Number:
Japanese Patent JP3160043
Kind Code:
B2
Abstract:
PURPOSE: To improve measuring accuracy by connecting a signal source to a winding with a larger number of turns among those of a transformer.
CONSTITUTION: A signal source 2 is connected to a transformer 10 through a switch 30. When the switch 30 selects any one of windings 12 and 14, a control calculation means 40 compares measured values of voltage of voltmeters 4 and 6 to introduce an output of the signal source 2 to the side of the winding generating a higher voltage. Then, a transformer parameter is calculated from measured values of an ammeter 8 and the voltmeters 4 and 6 as required. This reduces effect of the resistance of the winding on the measurement of voltage and that of input capacities of the voltmeters 4 and 6 on the measurement of current thereby enabling measurement with higher accuracy.
Inventors:
Yasuaki Komatsu
Application Number:
JP34388691A
Publication Date:
April 23, 2001
Filing Date:
December 02, 1991
Export Citation:
Assignee:
Agilent Technologies, Inc.
International Classes:
G01R31/06; G01R27/26; G01R29/20; (IPC1-7): G01R31/06; G01R27/26; G01R29/20
Domestic Patent References:
| JP6432180A | ||||
| JP6071971A |
Attorney, Agent or Firm:
Kimihisa Kato