MULTIPLE LIGHT PATH INTERFERENCE LIGHT-MEASURING METHOD AND APPARATUS THEREOF

Japanese Patent JP3880873

B2

PROBLEM TO BE SOLVED: To set modulation conditions according to conditions to be measured and to improve measurement accuracy when measuring double ray scattered light and multiple light path interference light due to the reflection of a connector end by a pulse-OSA method.
SOLUTION: The period of pulse modulation to a light source is set corresponding to the length of a light medium to be measured, modulated pulse light is inputted to the light medium, a pulse signal for modulation with the same period as the set period is used, output pulse signal light from the light medium is modulated, wavelength dependency of light power after the modulation is observed, and the power of the multiple light path interference light is measured.

Shinichiro Muro
Yasushi Sugaya

JP2002059777A

February 14, 2007

March 06, 2002

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富士通株式会社

G01M11/02; (IPC1-7): G01M11/02

JP9054013A
JP10084318A
JP9018391A
JP8248454A
JP8136405A
JP8114528A
JP8102726A
JP7226549A
JP6224492A
JP5257177A

WO1994001942A1

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2002年電子情報通信学会総合大会講演論文集 通信(2),(社)電子情報通信学会,2002年 3月 7日,p.473
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IEEE Photonic Technology Letters ,2000年 5月,Vol.12 No.5,p.528~530

Yoshiyuki Osuga
Motoaki Hisagi

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