MUTILAYER-TYPE PROBE PIN AND PROBE CARD

Title:

MUTILAYER-TYPE PROBE PIN AND PROBE CARD

Document Type and Number:

Japanese Patent JP2007256078

Kind Code:

A

Abstract:

To provide a multilayer-type probe pin and a probe card, capable of ensuring ample solder joint strength, even when using a lead-free solder, and capable of efficiently and surely carrying out soldering operation.

The multilayer-type probe pin being comprising a center member, an insulating layer for covering the center member, and a conductive metal layer formed on the outer circumference of the insulating layer, is such that the surface roughness Ra of the conductive metal layer is 30 μm or smaller, and that a conductive thin-film layer is formed on at least a portion of the surface of the conductive metal layer; and the probe card comprises by jointing the mutilayer-type probe thereto by using lead-free solder.

Inventors:

YAMAMOTO SHINICHI

Application Number:

JP2006080848A

Publication Date:

October 04, 2007

Filing Date:

March 23, 2006

Export Citation:

Click for automatic bibliography generation Help

Assignee:

TOSHIBA CORP
TOSHIBA MATERIALS CO LTD

International Classes:

G01R1/067; G01R1/073; G01R31/26; H01L21/66

Domestic Patent References:

JP2006071357A	2006-03-16
JP2002164106A	2002-06-07
JP2004172378A	2004-06-17
JPH0722268A	1995-01-24

Attorney, Agent or Firm:

Kenji Yoshitake
Yukitaka Nakamura
Konno Akio
Noritaka Yokota

Previous Patent: VIDEO REPLAY SPEED CONTROL DEVICE FOR VEHICLE

Next Patent: LENS METER