Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
X-RAY EXPOSURE APPARATUS
Document Type and Number:
Japanese Patent JP3027240
Kind Code:
B2
Abstract:

PURPOSE: To obtain an X-ray exposure apparatus in which an incident position can constantly be maintained without applying disturbance to a radiation light incident in a predetermined incident position when a synchrotron radiation light is made incident the incident position.
CONSTITUTION: Radiation light position detectors 8, 9, 10 are provided for parts of a radiation light having a spread regulated by a slit 2, which are not incident on a planar mirror 3. A microcomputer 17 receives pieces of positional information of radiation surfaces from the detectors 8, 9, 10. The microcomputer 17 calculates positional deviation from the information, applies a control signal for correcting the deviation to a six-axis driving mechanism 18 so that the radiation light is always incident in a predetermined position of an X-ray mask 5.


Inventors:
Hitoshi Kametani
Hifumi Takashi
Application Number:
JP20568291A
Publication Date:
March 27, 2000
Filing Date:
July 23, 1991
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Mitsubishi Electric Corporation
International Classes:
G03F7/20; H01L21/027; (IPC1-7): H01L21/027; G03F7/20
Domestic Patent References:
JP63138731A
JP3222299A
Attorney, Agent or Firm:
Hiroaki Tazawa (2 outside)



 
Previous Patent: サンダル台

Next Patent: FOREIGN-MATTER INSPECTING APPARATUS