Title:
X-RAY EXPOSURE APPARATUS
Document Type and Number:
Japanese Patent JP3027240
Kind Code:
B2
Abstract:
PURPOSE: To obtain an X-ray exposure apparatus in which an incident position can constantly be maintained without applying disturbance to a radiation light incident in a predetermined incident position when a synchrotron radiation light is made incident the incident position.
CONSTITUTION: Radiation light position detectors 8, 9, 10 are provided for parts of a radiation light having a spread regulated by a slit 2, which are not incident on a planar mirror 3. A microcomputer 17 receives pieces of positional information of radiation surfaces from the detectors 8, 9, 10. The microcomputer 17 calculates positional deviation from the information, applies a control signal for correcting the deviation to a six-axis driving mechanism 18 so that the radiation light is always incident in a predetermined position of an X-ray mask 5.
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Inventors:
Hitoshi Kametani
Hifumi Takashi
Hifumi Takashi
Application Number:
JP20568291A
Publication Date:
March 27, 2000
Filing Date:
July 23, 1991
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G03F7/20; H01L21/027; (IPC1-7): H01L21/027; G03F7/20
Domestic Patent References:
JP63138731A | ||||
JP3222299A |
Attorney, Agent or Firm:
Hiroaki Tazawa (2 outside)