Title:
【発明の名称】誘導結合プラズマ質量分析用試料導入装置
Document Type and Number:
Japanese Patent JP2598073
Kind Code:
B2
Abstract:
PURPOSE:To make it possible to analyze a superminute component in a sample at a high sensitivity, at a high accuracy, and rapidly, by providing a heating device at the outside of the connection between a cuvette and a plasma torch. CONSTITUTION:When an evaporated sample gas is led in to a plasma torch through a connection tube 121, an infrared heating device 131 is provided at the outside of the tube 121 as a heating device. Consequently, the temperature of the tube 121 can be raised easily, and the condensation and the adsorption of the evaporated sample gas passing through the tube 121 can be suppressed. As a result, the leading-in efficiency of the objective component to the plasma torch can be improved extensively, and the memory effect can be eliminated.
Inventors:
Hidenori Matsunaga
Naoyuki Hirate
Naoyuki Hirate
Application Number:
JP6346688A
Publication Date:
April 09, 1997
Filing Date:
March 18, 1988
Export Citation:
Assignee:
Toshiba Corporation
International Classes:
G01N27/62; H01J49/04; H01J49/10; (IPC1-7): H01J49/04; G01N27/62
Domestic Patent References:
| JP6126843A | ||||
| JP54170186U |
Attorney, Agent or Firm:
Takehiko Suzue (2 outside)