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Title:
CLEANING METHOD OF SEMICONDUCTOR SUBSTRATE
Document Type and Number:
Japanese Patent JPH0613363
Kind Code:
A
Abstract:

PURPOSE: To provide a cleaning method of a semiconductor substrate which exhibits higher safety to human bodies and environments and excellent cleaning effect, and which is with specific volatile methyl polysiloxanes, and thereafter performing an alcohol substitution and washing the semiconductor substrate.

CONSTITUTION: A wafer is subjected to ultrasonic cleaning using a cleaning solution composed of a mixture of linear methyl polysiloxane represented by a formula I and a cyclic methyl polysiloxane represented by a formula II. In the formula I m=0-4 and in the formula II n=3-6. Then, ultrasonic cleaning with ethanol is performed, and further ultrasonic cleaning with water is performed, and finally IPA paper drying (a process of dewatering and drying in a state where isopropyl alcohol is heated to about 120-150°C.) is performed. Hereby, a satisfactory cleaning result is ensured compared with prior art 1,1,1- trichloroethane.


Inventors:
YANAGISAWA MUNEHISA
HIGUCHI SUSUMU
TAMURA YUKI
OTAKI NORIO
KUWATA SATOSHI
Application Number:
JP19154292A
Publication Date:
January 21, 1994
Filing Date:
June 25, 1992
Export Citation:
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Assignee:
SHINETSU CHEMICAL CO
SHINETSU HANDOTAI KK
International Classes:
H01L21/304; (IPC1-7): H01L21/304
Domestic Patent References:
JPH04124289A1992-04-24
Attorney, Agent or Firm:
Shoji Ishihara