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Patent Searching and Data


Title:
AUTOMATIC INSPECTION SYSTEM OF MAGNETIC HEAD
Document Type and Number:
Japanese Patent JPH0620236
Kind Code:
A
Abstract:

PURPOSE: To enhance the cost-performance of an apparatus by a method wherein the loading operation of an uninspected head onto a test disk for a levitation- amount measuring device and an electromagnetic-conversion characteristic measuring device is performed by one common carriage mechanism.

CONSTITUTION: A levitation-amount measuring device 4 and an electromagnetic- conversion characteristic measuring device 5 are arranged in parallel. In the measuring device 4, a glass disk 4b is mounted on a spindle 4a, and a levitation- amount measuring part 4d is installed. In the measuring device 5, a magnetic disk 5b is mounted on a spindle 5a, and an electromagnetic characteristic measuring part 5d is installed. The following are installed: a common carriage mechanism 8 which is common to both measuring devices 4, 5; and a movement mechanism 9 which is composed of a guide rail 9a installed between both devices, a drive part 9b moving the carriage mechanism 8 along it and a control circuit 9c for the drive part. When an inspection is executed, the drive part 9b is controlled by the control circuit 9c, the common carriage mechanism 8 is moved and stopped at the position of the levitation-amount measuring device 4, an uninspected head 1 is mounted on the mechanism 8 and a levitation amount is measured.


Inventors:
HIDA FUMIO
Application Number:
JP3412492A
Publication Date:
January 28, 1994
Filing Date:
January 24, 1992
Export Citation:
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Assignee:
HITACHI ELECTR ENG
International Classes:
G11B5/455; (IPC1-7): G11B5/455
Attorney, Agent or Firm:
Kajiyama Bozen (1 person outside)