Title:
PARALLAX REFRACTOMETER
Document Type and Number:
Japanese Patent JP2504356
Kind Code:
B2
Abstract:
PURPOSE: To cope with both applications in high sensitivity and low sensitivity without replacing a flow cell.
CONSTITUTION: A photodetector 30 is divided into four parts 44-1, 44-2, 44-3 and 44-4 with a first straight line 40 in the direction, which is orthogonal to the moving direction of a slit image 6, and a second straight line 42, which has the inclination with respect to the moving direction of the slit image 6 and intersects the first straight line 40. When the strengths of the detected signals at the respective photodetector parts are made to be S1-S4, the signals are processed as Sa=c{(S2+S3)-(S1+S4)}/{(S2+S3)+(S1+S4)} in analyzing mode and SP=c{(S1+S2)-(S3+S4)}/{(S1+S2)+(S3+S4)} in preparing mode.
Inventors:
KITAOKA MITSUO
Application Number:
JP11795292A
Publication Date:
June 05, 1996
Filing Date:
April 09, 1992
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N21/41; G01N30/74; (IPC1-7): G01N21/41; G01N30/74
Domestic Patent References:
| JP3162651A | ||||
| JP60250230A | ||||
| JP5215676A | ||||
| JP61226640A | ||||
| JP6327733A | ||||
| JP6095546U |
Attorney, Agent or Firm:
Noguchi Shigeo