【発明の名称】外観検査装置 - MITSUBISHI ELECTRIC CORP

Title:

【発明の名称】外観検査装置

Document Type and Number:

Japanese Patent JP2560414

Kind Code:

B2

More Like This:

JP2006162427	METHOD AND DEVICE FOR INSPECTING LED CHIP
WO/2021/148972	THREE-DIMENSIONAL OPTICAL MEASURING APPARATUS FOR ROPES WITH LIGHTING DEVICE
JP2000171225	METHOD AND DEVICE FOR THREE-DIMENSIONAL INPUT

Inventors:

SATO HAJIME
ENOSHIMA SHINJI
TONO NAOMI

Application Number:

JP12236488A

Publication Date:

December 04, 1996

Filing Date:

May 18, 1988

Export Citation:

Assignee:

MITSUBISHI ELECTRIC CORP

International Classes:

G01B11/24; H04N5/222; H04N7/18; (IPC1-7): G01B11/24; H04N7/18

Domestic Patent References:

Attorney, Agent or Firm:

Kaneo Miyata (3 outside)

Previous Patent: 小型のズームレンズ

Next Patent: 電子制御ポンプ