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Title:
ANALYZING METHOD USING FTIR
Document Type and Number:
Japanese Patent JPH0735688
Kind Code:
A
Abstract:

PURPOSE: To obtain an analyzing method using FTIR which enables execution of measurement in a short time, by enabling attainment of a plurality of absorption spectrums by scanning a movable mirror at only one time.

CONSTITUTION: An interferogram is sampled by a frequency being N times higher than the frequency based on a sampling theorem. A first data group is prepared by extracting this sampled interferogram at an interval of data in the number of N-1, starting from/the first data, a second data group is prepared by extracting it at the interval of the data in the number of N-1, starting from the second data, and data groups in the number of N are prepared in the same way. Absorption spectrums in the number of N based on the sampling theorem are determined by subjecting each of these data groups to FFT, and these absorption spectrums are integrated.


Inventors:
NISHIMURA KATSUMI
Application Number:
JP19920293A
Publication Date:
February 07, 1995
Filing Date:
July 17, 1993
Export Citation:
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Assignee:
HORIBA LTD
International Classes:
G01J3/45; G01N21/35; (IPC1-7): G01N21/35; G01J3/45
Attorney, Agent or Firm:
Hideo Fujimoto