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Title:
NEUTRON DETECTION STRUCTURE
Document Type and Number:
Japanese Patent JP2010004038
Kind Code:
A
Abstract:

To provide a neutron detection structure readily manufactured and utilizing a readily available SOI SRAM.

The neutron detection structure composed of a silicon-on-insulator memory cell includes a conversion layer for converting incident neutrons into charged particles; a device layer accepting the charged particles; an embedded oxide layer directly adjacent to the device layer and the conversion layer for isolating the conversion layer from the device layer; an insulating layer, a passivation layer formed on the insulating layer, opposed to the buried oxide layer and the device layer and a plurality of conductive contacts providing electrical contact to the device layer.


Inventors:
KEYSER THOMAS R
YUE CHEISAN J
Application Number:
JP2009138161A
Publication Date:
January 07, 2010
Filing Date:
June 09, 2009
Export Citation:
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Assignee:
HONEYWELL INT INC
International Classes:
H01L31/09; G01T3/08
Domestic Patent References:
JP2001511605A2001-08-14
JP2006525677A2006-11-09
JPS6135384A1986-02-19
JPH05281364A1993-10-29
JP2007516432A2007-06-21
JPH05182909A1993-07-23
JP2007509345A2007-04-12
JP2002501679A2002-01-15
Attorney, Agent or Firm:
Shinjiro Ono
Kazuo Shamoto
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Naoki Kazuma