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Title:
NEUTRON SENSOR WITH THIN INTERCONNECT STACK
Document Type and Number:
Japanese Patent JP2011158475
Kind Code:
A
Abstract:

To provide a semiconductor device for neutron detection which is more inexpensive, smaller, mechanically stronger, and which has a smaller power consumption than a gas-filled proportional neutron detector.

The semiconductor device includes a substrate 12, an activated semiconductor layer 14 situated on the substrate 12, a stack 16 of interconnect layers deposited on the activated semiconductor layer, and a neutron conversion layer 20 deposited on the stack 16 of the interconnect layers, wherein the stack 16 of the interconnect layers is configured such that at least about 10% of secondary charged particles generated in the neutron conversion layer 20 has a sufficient ion track length in the activated semiconductor layer 14 to generate a detectable charge. Another semiconductor device includes a substrate 12, an activated semiconductor layer 14 situated on the substrate 12, a neutron conversion layer 20 deposited on the activated semiconductor layer 14, and a stack 16 of interconnect layers deposited on the neutron conversion layer 20.


Inventors:
RANDAZZO TODD ANDREW
LARSEN BRADLEY J
FECHNER PAUL S
Application Number:
JP2011016470A
Publication Date:
August 18, 2011
Filing Date:
January 28, 2011
Export Citation:
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Assignee:
HONEYWELL INT INC
International Classes:
G01T3/08
Attorney, Agent or Firm:
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Naoki Kazuma