Title:
NOISE MEASUREMENT PROGRAM, NOISE MEASUREMENT METHOD, AND NOISE MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2023020684
Kind Code:
A
Abstract:
To reduce the number of measurement times in near electromagnetic field measurement of a circuit board.SOLUTION: A noise measurement program allows a computer to execute acquisition of time-series data for showing electromagnetic field strength from a measured circuit that is measured during measurement time having a time interval of at least one wavelength of a reference signal in synchronization with a trigger detected based on a signal waveform of a reference signal inputted to a measured circuit that performs switching operation following a reference signal in each of multiple measurement points set near the measured circuit, and extraction of time-series data in a designated section that is designated by time width shorter than time width of measurement time from acquired time-series data, calculation of electromagnetic field strength and phase components at a designated frequency that is designated regarding each of multiple measurement points on the basis of time-series data in a designated section, and output of a plane vector corresponding to electromagnetic field strength and phase components regarding multiple measurement points under a condition of a designated section and a designated frequency.SELECTED DRAWING: Figure 1
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Inventors:
IKENAGA MICHIKAZU
Application Number:
JP2021126181A
Publication Date:
February 09, 2023
Filing Date:
July 30, 2021
Export Citation:
Assignee:
TAIYO YUDEN KK
International Classes:
G01R29/08
Attorney, Agent or Firm:
Sakai International Patent Office
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