Title:
非破壊検査装置
Document Type and Number:
Japanese Patent JP5013363
Kind Code:
B2
Inventors:
Hideo Itozaki
Application Number:
JP2006240323A
Publication Date:
August 29, 2012
Filing Date:
September 05, 2006
Export Citation:
Assignee:
National University Corporation Osaka University
Nichizo Tech Co., Ltd.
Nichizo Tech Co., Ltd.
International Classes:
G01B7/06; G01N27/82
Domestic Patent References:
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Attorney, Agent or Firm:
Hidehiko Ito
Morishita Hachiro
Hiroyuki Yoshida
Morishita Hachiro
Hiroyuki Yoshida