Title:
NON-DESTRUCTIVE INSPECTION METHODS, SYSTEMS AND APPARATUSES USING FOCUSABLE X-RAY BACKSCATTER DETECTORS
Document Type and Number:
Japanese Patent JP2020204608
Kind Code:
A
Abstract:
To provide non-destructive X-ray backscatter inspection apparatuses significantly improved in imaging characteristics that can be interpreted from imaging signals generated by X-ray backscatter detectors.SOLUTION: A non-destructive X-ray backscatter inspection apparatus 10 comprises: an X-ray radiation source 13, where X-ray beams 13 are configured to at least partially penetrate a surface of a target 18; a collimator 14 configured to form an X-ray beam 13 using a portion of the X-ray radiation emitted by the X-ray radiation source 13; and a flexible X-ray backscatter detector 20 configured to detect X-ray backscatter formed in response to the X-ray beam 13 encountering the target 18. The flexible X-ray backscatter detector 20 comprises a scintillating material layer comprising a scintillating jet print ink, and is deformable.SELECTED DRAWING: Figure 1A
Inventors:
MORTEZA SAFAI
Application Number:
JP2020086462A
Publication Date:
December 24, 2020
Filing Date:
May 18, 2020
Export Citation:
Assignee:
BOEING CO
International Classes:
G01N23/20008; G01N23/203; G01T1/20
Attorney, Agent or Firm:
Sonoda/Kobayashi Patent Business Corporation