Title:
高温プラズマ内の低磁場およびヌル磁場の非摂動測定
Document Type and Number:
Japanese Patent JP7095924
Kind Code:
B2
Abstract:
Systems and methods that facilitate non-pertubative measurements of low and null magnetic field in high temperature plasmas.
More Like This:
Inventors:
Deepak K. Gupta
Richard Ignas
Kenneth H. Nordsiek
Richard Ignas
Kenneth H. Nordsiek
Application Number:
JP2021111267A
Publication Date:
July 05, 2022
Filing Date:
July 05, 2021
Export Citation:
Assignee:
TAE Technologies, Incorporated
International Classes:
H05H1/00; G21B1/05; G21B1/23
Domestic Patent References:
| JP2004522158A |
Foreign References:
| US20090073442 |
Other References:
Sylvie Sahal Broeechot,The Hanle effect applied to magnetic field diagnostics,Space Science Review,Kluwer Academic Publishers,1981年12月,volume 29,pp.391-401
R. Presura,Hanle effect as candidate for measuring magnetic fields in laboratory plasmas,Review of Scientific Instruments,AIP Publishing,2012年08月01日,volume 83, issue 10,10D528
R. Presura,Hanle effect as candidate for measuring magnetic fields in laboratory plasmas,Review of Scientific Instruments,AIP Publishing,2012年08月01日,volume 83, issue 10,10D528
Attorney, Agent or Firm:
Shusaku Yamamoto
Morishita Natsuki
Takatoshi Iida
Daisuke Ishikawa
Kensaku Yamamoto
Morishita Natsuki
Takatoshi Iida
Daisuke Ishikawa
Kensaku Yamamoto