To prevent the reliability of data protection from deteriorating and a data writing speed from lowering by controlling the distribution of the threshold voltages Vt of a memory cell after data writing for each of respective chips.
A word line voltage control circuit 12a which is a voltage control means for controlling the control voltages to be impressed to respective word lines connected with control gates has a gate voltage memory circuit 22 which is a memory means for storing the values (voltage values) determined to confine the distribution of the threshold voltages into a prescribed range according to the distribution of the threshold voltages of a plurality of the memory cells obtained by a data writing test for each chip and a word line regulator circuit 23 which is a voltage output means for outputting the prescribed control voltages to be impressed to the control gates by using the values (voltage values) stored in the circuit 22 to respective column lines.
KAWACHI SHUICHIRO
Takaaki Yasumura
Takeshi Oshio
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