Title:
NONCONTACT PHYSICAL QUANTITY MEASUREMENT METHOD, PHYSICAL QUANTITY MEASUREMENT APPARATUS AND SEMICONDUCTOR ELEMENT
Document Type and Number:
Japanese Patent JP2003344182
Kind Code:
A
Abstract:
To provide a measurement method and a means for eliminating attachment of a large communicator for hardly and directly picking up a signal such as an internal temperature of a rotational element such as a vehicle tire, etc., due to an intervention of a rotational shaft and having a power supply.
An electromagnetic wave with a predetermined frequency is radiated to a small semiconductor element internally attached to a measured object, and constituted so as to change a resonance frequency by a physical quantity such as a temperature, pressure, etc. The physical quantity is measured by detecting the resonance by using a receiver.
Inventors:
KANO SHIRO
MIYAGAWA SHIGEO
MIYAGAWA SHIGEO
Application Number:
JP2002156325A
Publication Date:
December 03, 2003
Filing Date:
May 29, 2002
Export Citation:
Assignee:
YAMATAKE CORP
International Classes:
G01K7/36; G01K7/34; G08C17/02; G08C19/12; (IPC1-7): G01K7/36; G01K7/34; G08C17/02; G08C19/12
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