Title:
非破壊解析装置
Document Type and Number:
Japanese Patent JP7281892
Kind Code:
B2
Abstract:
To allow a user to observe a nailing test on a lithium ion battery with a lamination structure, for example, and at the same time check the position where the nail is entering, the state of each electrode, and the short-circuit voltage, the current, and the temperature of the battery.SOLUTION: An X-ray detector 3 detects an X-ray emitted from an X-ray detector 1 to go through an inspection target object W, and obtains an image of an X-ray perspective view by an image formation device 5 by making an image out of the output. An event generator 8 stimulates the inspection target object W. A measurement device 9 measures the state of the inspection target object W which has changed by the stimulation. A controller 6 controls the state of the event generator 8 and the position of the X-ray generator 1 on the basis of the result of the measurement by the measurement device 9.SELECTED DRAWING: Figure 1
Inventors:
Masanori Kunimoto
Miwako Mizuno
Masami Tomizawa
Norihito Togashi
Toshinori Uchida
Miwako Mizuno
Masami Tomizawa
Norihito Togashi
Toshinori Uchida
Application Number:
JP2018210791A
Publication Date:
May 26, 2023
Filing Date:
November 08, 2018
Export Citation:
Assignee:
Toshiba IT Control System Co., Ltd.
International Classes:
G01N23/04; G01B15/04; G01B15/06; G01N3/30; G01N23/046
Domestic Patent References:
JP2007315874A | ||||
JP2015232453A | ||||
JP2017032325A | ||||
JP2012215537A | ||||
JP2009158266A | ||||
JP2017067456A | ||||
JP2006138869A | ||||
JP2009276140A | ||||
JP2003156455A | ||||
JP8297103A | ||||
JP2015158406A | ||||
JP2014165026A | ||||
JP2005195414A |
Attorney, Agent or Firm:
Mitsuharu Kiuchi
Koichi Okuma
Sadanori Katagiri
Kanako Kiuchi
Koichi Okuma
Sadanori Katagiri
Kanako Kiuchi
Previous Patent: Light-emitting element, display device, electronic device, and lighting device
Next Patent: PROCESSING SYSTEM AND ARITHMETIC METHOD
Next Patent: PROCESSING SYSTEM AND ARITHMETIC METHOD