Title:
オフアングル中性子積分フラックス測定演算装置及びその方法
Document Type and Number:
Japanese Patent JP5028690
Kind Code:
B2
More Like This:
JP2013537622 | Neutron detector with WAFER-TO-WAFER bonding |
WO/2020/172279 | NEUTRON IMAGING SYSTEM HAVING NEUTRON SHIELD |
WO/2007/065004 | CONTAINER VERIFICATION SYSTEM FOR NON-INVASIVE DETECTION OF CONTENTS |
Inventors:
Hiroaki Asai
Kenji Sugimoto
Isamu Yashiyama
Yoshiide Iide
Mieko Matsuda
Amano Yukio
Kenji Sugimoto
Isamu Yashiyama
Yoshiide Iide
Mieko Matsuda
Amano Yukio
Application Number:
JP2008231239A
Publication Date:
September 19, 2012
Filing Date:
September 09, 2008
Export Citation:
Assignee:
hirec corporation
International Classes:
G01T3/08
Domestic Patent References:
JP2005274379A | ||||
JP7318657A |
Other References:
G.L. Morgan, D.K. Olsen, J.W. McConnell,A proton-recoil telescope for in-line absolute neutron fluence measurements,Nuclear Instruments and Methods,1978年,Vol. 157,pp. 525-535
Attorney, Agent or Firm:
Sadao Kumakura
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Naoki Kondo
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Naoki Kondo