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Patent Searching and Data


Title:
OFFSET CORRECTION METHOD FOR RELUCTANCE ANGLE SENSOR
Document Type and Number:
Japanese Patent JP2000146621
Kind Code:
A
Abstract:

To calibrate offset using an inexpensive convenient circuit by determining an offset calibration signal using an angle signal being delivered from a Wheatstone bridge in the absence of DC field as a measure of offset of the Wheatstone bridge.

Total value of output voltages from Wheatstone bridges 1, 2 is maximized only when a DC field acts on the Wheatstone bridges in a direction perpendicular to a first pair of reluctance 3 or a second pair of reluctance 4. After the DC field is removed, a larger shift of a measured output voltage from an offset voltage is measured. Consequently, the output voltage being removed by the Wheatstone bridges 1, 2 is a measure of offset voltage of the Wheatstone bridge. A voltage being delivered from the Wheatstone bridge under absence of DC field is employed by an evaluation circuit for offset correction.


Inventors:
WAFFENSCHMIDT EBERHARD
Application Number:
JP32083799A
Publication Date:
May 26, 2000
Filing Date:
November 11, 1999
Export Citation:
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Assignee:
KONINKL PHILIPS ELECTRONICS NV
International Classes:
G01B7/00; G01B7/30; G01D3/028; G01D5/14; G01D5/244; G01D5/245; G01R17/10; G01R33/09; (IPC1-7): G01D3/028; G01B7/30; G01D5/245; G01R17/10; G01R33/09
Attorney, Agent or Firm:
Akihide Sugimura (2 outside)