Title:
OPERATION ANALYSIS DISPLAY SYSTEM
Document Type and Number:
Japanese Patent JP2020014035
Kind Code:
A
Abstract:
To achieve high user's satisfaction by accelerating the identification of possible causes when a defect report is received from a user.SOLUTION: The operation analysis display system, provided with a switch notifying a user of a defect when the use feels a state of the defect, compares operation log data stored before the switch is depressed to database storing existing possible causes for defects for analysis and displays an optimum solutions and possible causes on a user's smart phone.SELECTED DRAWING: Figure 6
Inventors:
KANAZAWA DAISUKE
HASEGAWA AKIRA
KASAHARA MASAYA
ITO NORIKAZU
HASEGAWA AKIRA
KASAHARA MASAYA
ITO NORIKAZU
Application Number:
JP2018132850A
Publication Date:
January 23, 2020
Filing Date:
July 13, 2018
Export Citation:
Assignee:
HITACHI GLOBAL LIFE SOLUTIONS INC
International Classes:
H04M11/00; F24F11/38; F24F11/52; F24F11/56; G06F11/07; H04Q9/00
Attorney, Agent or Firm:
Yuji Toda