Title:
OPHTHALMOLOGIC EXAMINATION APPARATUS
Document Type and Number:
Japanese Patent JP2021153907
Kind Code:
A
Abstract:
To easily keep a tip end part coming close to an examined eye in a clean state.SOLUTION: An ophthalmologic examination apparatus 1 includes an imaging unit 2, 3, a detection part 20, and a pseudo response part 25. A sensor 20 is used for detecting a proximity state in which a subject is proximate or a non-proximity state. The pseudo response part 25 reproduces the proximity state without requiring the subject to come close, and makes the sensor detect the reproduced proximity state. A determination means which controls a reproducing means to reproduce the proximity state and determines whether the sensor normally operates or not based on an output signal from the sensor at the time of reproducing is provided.SELECTED DRAWING: Figure 3
Inventors:
MABUCHI HIKARU
Application Number:
JP2020057952A
Publication Date:
October 07, 2021
Filing Date:
March 27, 2020
Export Citation:
Assignee:
NIDEK KK
International Classes:
A61B3/10