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Title:
OPTICAL ANALYSIS APPARATUS
Document Type and Number:
Japanese Patent JP2009058405
Kind Code:
A
Abstract:

To provide an optical analysis apparatus that irradiates a sample with a plurality of irradiation lights and measures and analyzes a plurality of radiation lights, and can acquire measurement data without crosstalk without increasing a signal processing burden of the measurement data.

This optical analysis apparatus includes light irradiating means for selectively irradiating the sample with the plurality of irradiation lights, a plurality of light detecting means for selectively detecting each of the plurality of radiation lights, and measurement controlling means for controlling measurement of the radiation light. When the measurement controlling means selects one of the plurality of irradiation lights to be emitted to the sample, photodetection permitting means permits the detection of the radiation light of only the light detecting means for detecting the radiation light to be emitted from the sample correspondingly to the selected irradiation light.


Inventors:
SUZUKI AKIYOSHI
Application Number:
JP2007226746A
Publication Date:
March 19, 2009
Filing Date:
August 31, 2007
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G01N21/64
Domestic Patent References:
JPH11271636A1999-10-08
Attorney, Agent or Firm:
Akashi Masatake
Kenichiro Akashi



 
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