Title:
光学特性検査機及び光学特性検査方法
Document Type and Number:
Japanese Patent JP6777289
Kind Code:
B2
Abstract:
The present application relates to a device for testing optical properties and a method for testing optical properties using the same. The device of the present application has inexpensive manufacturing and maintenance costs, is capable of testing a wide range of plane directional phase differences, and provides the method for testing optical properties with improved identification efficiency of the phase retardation axis.
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Inventors:
Jo, Min Young
Park, Jin Young
Park, Don Min
Lee, Won Chu
Jun, Ki Jun
Park, Jin Young
Park, Don Min
Lee, Won Chu
Jun, Ki Jun
Application Number:
JP2019502083A
Publication Date:
October 28, 2020
Filing Date:
August 29, 2017
Export Citation:
Assignee:
LG HAUSYS,LTD.
International Classes:
G01J9/00; G01M11/00; G01N21/21; G02B5/30
Domestic Patent References:
| JP2005241406A |
Foreign References:
| US4310242 |
Attorney, Agent or Firm:
Longhua International Patent Service Corporation