Title:
OPTICAL CUTTING INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2018059777
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an optical cutting inspection device capable of changing the length of linear light.SOLUTION: An optical cutting inspection device according to one embodiment of the present invention includes a first light source and a shield unit. The first light source includes an emission unit for emitting a first light sheet that has a first rim and a second rim and spreads out between the first rim and the second rim. The shield unit includes a first end, blocks part of the first light sheet including the first rim to have a third rim extending from the first rim formed on the first light sheet, and can change the angle between the second rim and the third rim.SELECTED DRAWING: Figure 11
Inventors:
KAMINAKA MOTOYUKI
NAKAGAWA KEIJI
MATSUO HIROSHI
NAKAGAWA KEIJI
MATSUO HIROSHI
Application Number:
JP2016196582A
Publication Date:
April 12, 2018
Filing Date:
October 04, 2016
Export Citation:
Assignee:
RICOH ELEMEX CORP
International Classes:
G01B11/24; G01B11/30
Attorney, Agent or Firm:
Sakai International Patent Office