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Title:
OPTICAL DISPLACEMENT METER
Document Type and Number:
Japanese Patent JP2011039026
Kind Code:
A
Abstract:

To realize high resolution, quick response and smaller size of chromatic confocal displacement meter.

In an optical displacement meter, a wide band light source 22 is arranged at a confocal point position on the opposite side of an object (8), relative to an objective lens 12. A spatial filter is provided at a confocal position for the reflection light returning from the object, for penetration. A measured light of the wavelength focused on the object is extracted, and the wavelength of the measured light is identified, for measuring position of the object. There are provided a polarizer 52 which splits the measured light propagated in one direction by collimation into linear polarized light in X and Y directions orthogonal to the propagation direction Z, a wavelength plate 54 which allows the two linear polarized light in two direction to pass to form oval polarized light having phase difference corresponding to optical wavelength, a polarizing separation element 56 which splits the oval polarized light into polarized components in two directions between X and Y, and light receiving elements 58A and 58B for detecting an optical volume of each polarized component. (A-B)/(A+B) is calculated using optical volume signals A and B detected with the light receiving element.


Inventors:
MIKI YUTAKA
Application Number:
JP2009289793A
Publication Date:
February 24, 2011
Filing Date:
December 21, 2009
Export Citation:
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Assignee:
MITUTOYO CORP
International Classes:
G01C3/06; G01B11/00
Domestic Patent References:
JP2008256679A2008-10-23
JP2009103573A2009-05-14
JPH01113626A1989-05-02
JP2000186928A2000-07-04
JPH109827A1998-01-16
JP2004101532A2004-04-02
Attorney, Agent or Firm:
Satoshi Takaya
Keisuke Matsuyama
Tsuyoshi Makino