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Patent Searching and Data


Title:
光学エンコーダ
Document Type and Number:
Japanese Patent JP4266834
Kind Code:
B2
Abstract:
An optical position measuring system including a periodic grating structure and a scanning unit. The scanning unit includes a light source that directs light towards the periodic grating structure and an optical lens device that receives light from the periodic grating structure and creates an image of the periodic grating structure in an image plane, the optical lens device having a periodic lens array with a grating period, AG(r) or the mutual distance between adjoining lenses of said lens array defined by the equation: A G ( r ) = beta ( r ) * [ t ( r ) * [ k + i + n ] + psi ] ( beta ( r ) + 1 ) wherein AG(r) is the grating per t(r) the period of the periodic grating structure, |beta(r)| the absolute amount of the image magnification factor beta of the lens array Psi a presettable defined phase shift r the radius of the grating arrangement, wherein in the case of a linear grating r=∞ and AG,t and |beta| are constants, i, k, n epsilon N, i.e. are natural numbers, including zero.

Inventors:
Benner Ulrich
Meyer Elmer
Application Number:
JP2003584608A
Publication Date:
May 20, 2009
Filing Date:
April 02, 2003
Export Citation:
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Assignee:
DR. JOHANNES HEIDENHAIN GESELLSCHAFT MIT BESCHRANKTER HAFTUNG
International Classes:
G01D5/347; G01D5/38; G02B3/00
Domestic Patent References:
JP49042168B1
JP11160102A
JP7167678A
JP10213455A
JP8005325A
Foreign References:
GB2056660A
Attorney, Agent or Firm:
Mitsufumi Esaki
Okumura Yoshimichi
Blacksmith