Title:
光ファイバの漏洩損失測定方法
Document Type and Number:
Japanese Patent JP6597773
Kind Code:
B2
Abstract:
The present embodiment relates to a method of directly measuring a leakage loss from a peripheral core in a MCF with a coating to the coating. In the measurement method, in a high refractive-index state in which the coating is present on an outer periphery of a common cladding, first transmission power of measurement light, which propagates through the peripheral core of the MCF, is measured. On the other hand, in a low refractive-index state in which a low-refractive-index layer with a lower refractive index than the common cladding is provided on the outer periphery of the common cladding, second transmission power of the measurement light, which propagates through the peripheral core of the MCF, is measured. The leakage loss LL from the peripheral core to the coating is calculated as a difference between the first transmission power and the second transmission power.
Inventors:
Tetsuya Hayashi
Tetsuya Nakanishi
Tetsuya Nakanishi
Application Number:
JP2017509171A
Publication Date:
October 30, 2019
Filing Date:
December 14, 2015
Export Citation:
Assignee:
Sumitomo Electric Industries, Ltd.
International Classes:
G01M11/02; G01M11/00; G02B6/02; G02B6/44
Domestic Patent References:
| JP20128006A | ||||
| JP201545704A | ||||
| JP9265021A |
Foreign References:
| US20130251320 |
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
High Kunio Ki
Shotaro Terasawa
Yoshiki Kuroki
High Kunio Ki
Shotaro Terasawa