多色モードロックレーザを用いた光周波数測定装置及び測定方法 - National Institute of Advanced Industrial Science and Technology

Title:

多色モードロックレーザを用いた光周波数測定装置及び測定方法

Document Type and Number:

Japanese Patent JP4164599

Kind Code:

B2

Abstract:

To provide a light frequency measuring instrument and a measuring method having a wide range of measurable wavelengths and used for finding a carrier envelope offset frequency fceowith a high S/N.

The range of measurable wavelengths can be widened because of using a multi-color mode-locked laser light source 1. Further, it is not necessary to generate higher harmonic wave by means of a nonlinear optical effect after enlarging a spectrum, since this instrument is of a non-f-2f self-reference type wherein a heterodyne interference beat is detected between the other monochromatic light wave (light comb) obtained by the multiplexing of a first multiplexing means 4 and enlarged light wave (light comb), which enables to find the fceowith a high S/N.

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Inventors:

Hong Feng Lei
Kaoru Minoshima
Atsushi Ohnae
Koichi Matsumoto
Atsushi Yoshida

Application Number:

JP2003136429A

Publication Date:

October 15, 2008

Filing Date:

May 14, 2003

Export Citation:

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Assignee:

National Institute of Advanced Industrial Science and Technology
Aisin Seiki Co., Ltd.

International Classes:

G01J9/04; G02F1/37; G02F2/02; H01S3/00; H01S3/06; H01S3/098

Other References:

Optics Letters,2003年 9月 1日,Vol.28 No.17,p.1516~1518
2003年(平成15年)秋季第64回応用物理学会学術講演会講演予稿集第3分冊,(社)応用物理学会,2003年 8月30日,p.985
Optics Letters,2002年12月 1日,Vol.27 No.23,p.2127~2129
Science,2000年 4月28日,Vol.288 No.5466,p.635~639

Attorney, Agent or Firm:

Hiroshi Okawa

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