Title:
光学計測装置及び光学計測方法
Document Type and Number:
Japanese Patent JP7445201
Kind Code:
B2
Abstract:
Without requiring that thresholds be set for each measurement condition, the present invention makes it possible to determine whether noise that can occur in measured values is present. An optical measurement device 100 obtains measured values on the basis of the amount of reflected light that is received after being reflected by an object TA. The optical measurement device 100 comprises a setting unit 52 for setting a threshold for the amount of received reflected light per unit of time on the basis of characteristic information relating to the amount of light of the optical measurement device 100 and a determination unit 53 for determining whether there is measured value noise on the basis of the threshold.
Inventors:
Yosuke Kajii
Tomonori Kondo
Tomonori Kondo
Application Number:
JP2019170426A
Publication Date:
March 07, 2024
Filing Date:
September 19, 2019
Export Citation:
Assignee:
Omron Corporation
International Classes:
G01C3/06; G01B11/00
Domestic Patent References:
| JP2017173159A | ||||
| JP2010096570A | ||||
| JP2008139513A | ||||
| JP2018173559A | ||||
| JP2018136123A |
Attorney, Agent or Firm:
Yoshiyuki Inaba
Toshifumi Onuki
Akihiko Eguchi
Kazuhiko Naito
Toyotaka Abe
Toshifumi Onuki
Akihiko Eguchi
Kazuhiko Naito
Toyotaka Abe