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Title:
OPTICAL PHASE MEASUREMENT OF TARGET
Document Type and Number:
Japanese Patent JP2005257685
Kind Code:
A
Abstract:

To implement a phase detection system, based on surface plasmon resonance (SPR).

Optical phase detection includes both a step for generating first light waves having first polarized light and second light waves, having polarized light offset from the first polarized light and a step for providing relative delays between the first light waves and the second light waves. The relative delay generates an frequency offset between light waves, when a wavelength is adjusted over a specified wavelength range. A step of guiding the first light waves and the second light waves to a target provides third light waves and fourth light waves are provided. A polarized light component of the third light waves and a polarized light component of the fourth light waves are detected, and signals detected in the frequency offset are provided. The optical phase detection includes a step for extracting the phase difference, caused by the target between the polarized light component of the third light waves and the polarized light component of the fourth light waves.


Inventors:
VANWIGGEREN GREGORY D
ROITMAN DANIEL B
Application Number:
JP2005063708A
Publication Date:
September 22, 2005
Filing Date:
March 08, 2005
Export Citation:
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Assignee:
AGILENT TECHNOLOGIES INC
International Classes:
G01N21/21; G01J9/00; G01N21/27; G01N21/39; G01N21/55; (IPC1-7): G01N21/21; G01N21/27; G01N21/39
Attorney, Agent or Firm:
Satoshi Furuya
Takahiko Mizobe
Kiyoharu Nishiyama