To provide an optical pulse evaluation device and an in-service optical pulse evaluation device capable of evaluating a characteristic of an optical pulse itself or a sample incident therewith, in a relatively high bit-rate region.
An optical pulse 42 output repeatedly from an optical pulse light source 43 at a frequency frep is transmitted through the sample 93 on a sample stage 91 to be scanned by a wavelength-variable optical band pass filter 47. A detection result by a photodiode 51 is input into a phase detection circuit 45 together with the frequency frep serving as a reference, and a result thereof is computed by an operation unit 58C of a personal computer 52 to find a spectral phase and a spectral intensity of the optical pulse transmitted through the sample 93. Those are corrected by a computed result in the condition where the sample 93 is removed to evaluate the characteristics such as deterioration or the like of the optical pulse 42 by the sample 93. A waveform of the optical pulse 42 as a light source, or the like, is also able to be evaluated. The optical pulse in in-service is also able to be evaluated in the present invention.
TAKUSHIMA YUICHI
KOSEKI YASUYUKI
HIROTA YOICHI
