Title:
光信号品質モニタ装置、及び光信号品質モニタ方法
Document Type and Number:
Japanese Patent JP5223585
Kind Code:
B2
Inventors:
Hitoshi Takeshita
Application Number:
JP2008267645A
Publication Date:
June 26, 2013
Filing Date:
October 16, 2008
Export Citation:
Assignee:
NEC
International Classes:
H04B10/079; G01J4/04; G01M11/02
Domestic Patent References:
| JP2004138615A | ||||
| JP2005304048A | ||||
| JP2005043265A | ||||
| JP2008298778A |
Other References:
K.E.Cornick, et.al.,"All-Order PMD Penalty Prediction Using SOP String Lengths",Lasers and Electro-Optics Society,IEEE,2005年10月,LEOS 2005,WEE3,pp.702-703
Attorney, Agent or Firm:
Masahiko Desk
Naoki Shimosaka
Naoki Shimosaka