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Patent Searching and Data


Title:
光断層撮影装置及び方法
Document Type and Number:
Japanese Patent JP6570531
Kind Code:
B2
Abstract:
An optical tomography apparatus comprises: a polychromatic light source, a one-dimensional optical sensor, an interferometric microscope, a one-dimensional confocal spatial filtering system, an actuation system making it possible to perform a one-way scan depthwise of an object to be observed and a processor for reconstructing a two-dimensional image of a section of the object from a plurality of one-dimensional interferential images acquired by the image sensor during the one-way scan. An optical tomography method based on use of such an apparatus is also provided.

Inventors:
Dubois, Arnaud
Application Number:
JP2016541612A
Publication Date:
September 04, 2019
Filing Date:
December 19, 2014
Export Citation:
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Assignee:
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
Anstitu D'Puteque Graduate School
Universite Paris-Chuyud 11
International Classes:
G02B21/00; G01N21/17
Domestic Patent References:
JP2009020448A
JP2009505051A
Foreign References:
EP2447754A1
US20080246972
Other References:
SEOKHAN KIM,SIMULTANEOUS MEASUREMENT OF REFRACTIVE INDEX AND THICKNESS BY COMBINING LOW-COHERENCE INTERFEROMETRY AND CONFOCAL OPTICS,OPTICS EXPRESS,2008年 4月14日,VOL:16, NR:8,,PAGE(S):5516-5526,URL,http://dx.doi.org/10.1364/OE.16.005516
CHEN,YU et al.,HIGH-RESOLUTION LINE-SCANNING OPTICAL COHERENCE MICROSCOPY,OPTICS LETTERS,2007年 7月15日,Vol.32, No.14
Attorney, Agent or Firm:
Sakaki Morishita