Title:
OPTICAL WAVEGUIDE TYPE MICROPLATE
Document Type and Number:
Japanese Patent JP3668198
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an optical waveguide type microplate that can measure absorbance with high accuracy and further detect an antigen and antibody and the like in a solution to be inspected even when reducing the amount of a reagent added to the solution to be inspected.
SOLUTION: The microplate characterized in that it is provided with a substrate, a well storing the solution to be inspected formed on the surface at one side of the substrate, an optical waveguide layer formed at a part or all of the bottom of the well, and an optical incident member and optical radiation member individually formed on a surface nearby both ends in the longitudinal direction of the optical waveguide layer.
Inventors:
Shinji Uchiyama
Application Number:
JP2002040418A
Publication Date:
July 06, 2005
Filing Date:
February 18, 2002
Export Citation:
Assignee:
Toshiba Corporation
International Classes:
G01N21/64; B01L3/00; G01N21/03; G01N21/25; G01N21/27; G01N33/543; G02B6/12; G02B6/124; G02B6/42; (IPC1-7): G01N21/03; G01N21/27; G01N21/64
Domestic Patent References:
JP9061346A | ||||
JP10082738A | ||||
JP2001272330A | ||||
JP2001330560A | ||||
JP2000019100A |
Attorney, Agent or Firm:
Takehiko Suzue
Sadao Muramatsu
Atsushi Tsuboi
Ryo Hashimoto
Satoshi Kono
Makoto Nakamura
Shoji Kawai
Sadao Muramatsu
Atsushi Tsuboi
Ryo Hashimoto
Satoshi Kono
Makoto Nakamura
Shoji Kawai
Previous Patent: MULTIPLE ACCESS COMMUNICATION APPARATUS
Next Patent: METHOD OF MEASURING DEFORMATION OF TUNNEL
Next Patent: METHOD OF MEASURING DEFORMATION OF TUNNEL