Title:
最適化排他的二値化相関計測方法および最適化排他的二値化計測装置およびその方法を実行するプログラム
Document Type and Number:
Japanese Patent JP3554822
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To execute an exclusive binarization correlation measurement in the method and program executing the method for optimized exclusive binarization correlation measurement, by setting an allowable error span δfor judging whether the magnitudes of a reference signal and a measured signal are equal or not, at an optimum value. SOLUTION: Pixel values of each image of the reference signal and the measured signal are compared and exclusively binarized according to whether or not the values of the reference signal and the measured signal are equal. For the basis of judging whether or not the values of the reference signal and the measured signal are equal, the allowable error span is determined. According to the relation among the reference signal, the measured signal and the allowable error span, the exclusive binarization is applied to the measured signal, and the correlation of the reference signal and the measured signal is measured.
Inventors:
Makoto Oya
Application Number:
JP2001143873A
Publication Date:
August 18, 2004
Filing Date:
May 14, 2001
Export Citation:
Assignee:
National Institute of Information and Communications Technology
International Classes:
G01P3/80; G01P5/22; G06F17/15; G06T7/20; H04N5/225; H04N7/18; (IPC1-7): G01P5/22; G01P3/80; G06F17/15; G06T7/20; H04N5/225; H04N7/18
Domestic Patent References:
| JP62076468A | ||||
| JP62129778A | ||||
| JP8129025A |
Attorney, Agent or Firm:
Fukui Kunibashi
Yoshiyoshi Ogasawara
Kazuo Hosaka
Yoshiyoshi Ogasawara
Kazuo Hosaka