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Title:
OSCILLATION ANALYTIC METHOD AND OSCILLATION ANALYTIC EQUIPMENT
Document Type and Number:
Japanese Patent JP2009204517
Kind Code:
A
Abstract:

To provide an oscillation analytic method or oscillation analytic equipment capable of identifying features of a rigid body while hardly deteriorating identification accuracy even if measuring points to be actually measured are decreased.

The degree of freedom of a characteristic matrix to be identified is made to be larger than the measuring degree of freedom to be actually measured at measuring points in an oscillating test, and thus, the number of values of mode characteristic computed based on the measuring data is made to be smaller than the number of values of mode characteristic computed based on the characteristic matrix. When identifying the characteristic matrix, the characteristic matrix is identified by altering values of the component of the characteristic matrix so as to coincide with the value of the mode characteristic computed based on the characteristic matrix to the value of the mode characteristic computed based on measured data only for a mode characteristic corresponding to the mode characteristic computed based on the measuring data among the mode characteristics computed based on the characteristic matrix.


Inventors:
OKUMA MASAAKI
ROBERT J KLOEPPER
Application Number:
JP2008048277A
Publication Date:
September 10, 2009
Filing Date:
February 28, 2008
Export Citation:
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Assignee:
TOKYO INST TECH
International Classes:
G01M7/02; G01H17/00; G01M5/00; G01M99/00
Attorney, Agent or Firm:
Atsushi Aoki
Jun Tsuruta
Tetsuro Shimada
Koichi Ito
Shinji Mitsuhashi
Yoryo Mihashi