To solve the problem wherein a conventional oscillator for failure analysis often requires much time for specifying a location of poor contact because from failure occurred when a device 5 to be analyzed is vibrated as a whole with the energized device fixed on a test bench, it is estimated at which location of the device the poor contact has occurred.

The oscillator for failure analysis is constituted of the contact part 7 at the tip of the oscillated rod 6 which is vibrated along the longitudinal direction 6a by the driving force of the oscillation part 2, and the contact part 7 is brought into contact by each analysis location where oscillation test is carried out.