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Title:
OUTWARD APPEARANCE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2001116523
Kind Code:
A
Abstract:

To solve the problem that the number of microscope parts needs to be increased to shorten the tact time needed for inspection and the man-hour needed to adjust the optical axes of the microscope parts since the photodetection area of color components of red(R), green(G), and blue(B) is 1/3 time as large as the photodetection area of a monochromatic TDI line sensor as to an outward appearance inspection device which has one color TDI line sensor fitted to a microscope part 2 capable of moving freely in an X-Y direction.

A dichroic prism 3 is fitted to one microscope part 2 and spectrally diffuses light into color components of red(R), green(G), and blue(B), which are photodetected by monochromatic TDI line sensors 32 respectively to reduce the number of microscope parts to 1/3 as large as before.


Inventors:
KAMIGUCHI HIROSHI
Application Number:
JP29382999A
Publication Date:
April 27, 2001
Filing Date:
October 15, 1999
Export Citation:
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Assignee:
SOKKIA CO LTD
International Classes:
G01B11/24; G01B11/245; G01N21/62; G01N21/64; G01N21/88; (IPC1-7): G01B11/24
Domestic Patent References:
JPH1116498A1999-01-22
JPH11237210A1999-08-31
JPH11132720A1999-05-21
JPH08223408A1996-08-30
Attorney, Agent or Firm:
Kinichi Kitamura (3 others)