Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
【発明の名称】記憶領域の書き込み検査処理方法
Document Type and Number:
Japanese Patent JP2504570
Kind Code:
B2
Abstract:
PURPOSE:To speed up processing when the length of an area to be inspected is long by dividing a process of inspection by one-byte or one-word writing into three processes. CONSTITUTION:In a process P1, the head part 1 in the area 14 to be inspected is inspected by one-byte or one-word writing. In a process P2, the tail part 2 in the area 14 to be inspected is inspected by the one-byte or one-word writing. In a process P3, control units 3 and 4 of areas in the area 14 to be inspected are inspected, one by one, by the one-byte or one-word writing and it is judged that writing is possible when all the results of the inspection are acceptable. Thus, the misspecification of an area address is detected by the inspection in the process P1 and the misspecification of area length in the process P2 can be detected. Consequently, the execution time when the area length is long can be shortened greatly and the processing performance can be improved.

Inventors:
FUKUSHIMA HIROYUKI
Application Number:
JP18827289A
Publication Date:
June 05, 1996
Filing Date:
July 20, 1989
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FUJITSU LTD
International Classes:
G06F12/16; G06F12/14; G06F13/00; (IPC1-7): G06F12/14; G06F13/00
Domestic Patent References:
JP6118054A
JP63255751A
Attorney, Agent or Firm:
Yoshiyoshi Ogasawara (2 outside)



 
Previous Patent: JPH02504569

Next Patent: 半導体集積回路装置