Title:
INSPECTION METHOD AND DEVICE FOR LIQUID CRYSTAL PANEL
Document Type and Number:
Japanese Patent JPH06102193
Kind Code:
A
Abstract:
PURPOSE: To set temperature accurately and speedily in image characteristic inspection for liquid crystal panel.
CONSTITUTION: An inspection device is constituted of a support stage 12 for putting a liquid crystal panel 11 and a high temperature air production part 1 for producing high temperature air. A nozzle 5 connected to a high temperature air production part 1 introduces high temperature air in the vicinity of the liquid crystal panel put on the support stage 12. That is, by directly blowing the high temperature air kept at the predetermined temperature to the liquid crystal panel 11, the temperature of the liquid crystal panel 11 is controlled and the image characteristic inspection is performed.
Inventors:
YAMADA NAOKI
TAKAHASHI CHIE
SUGAWARA KIYOSHI
ABE MASAAKI
TAKAHASHI CHIE
SUGAWARA KIYOSHI
ABE MASAAKI
Application Number:
JP34553892A
Publication Date:
April 15, 1994
Filing Date:
December 01, 1992
Export Citation:
Assignee:
SONY CORP
International Classes:
G01N21/88; G01M11/00; G01N21/956; G02F1/13; (IPC1-7): G01N21/88; G02F1/13
Attorney, Agent or Firm:
Suzuki Harutoshi