Title:
【発明の名称】測定装置の外乱により惹起される誤特性の補償方法
Document Type and Number:
Japanese Patent JPH11512179
Kind Code:
A
Abstract:
PCT No. PCT/DE96/01657 Sec. 371 Date Jun. 11, 1998 Sec. 102(e) Date Jun. 11, 1998 PCT Filed Aug. 30, 1996 PCT Pub. No. WO97/09587 PCT Pub. Date Mar. 13, 1997A process for compensating for an incorrect operation of measuring devices fitted with a programming section caused by external influences. The measuring devices and a sensor responding to the influence are fitted in a chamber exposed to the influencing factor. When the influencing factor changes, measurements from the measuring device and the sensor are detected by a data processing system which provides the programming section of the measuring devices with signals compensating for the incorrect operation caused by the influencing factor. To perform such a process rapidly and thus economically, the influencing factor is continuously changed and the current output value of the sensor and the current measurement provided by the measuring device are detected with a timing predetermined by the data processing system.
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Inventors:
Chrisille, Burghard
Application Number:
JP51076997A
Publication Date:
October 19, 1999
Filing Date:
August 30, 1996
Export Citation:
Assignee:
Siemens Aktiengesellschaft
International Classes:
G01D3/028; G01D3/036; G01L19/04; (IPC1-7): G01D3/028
Attorney, Agent or Firm:
Tomimura Kiyoshi