Title:
PARAMETER DATA INQUIRY SYSTEM, PARAMETER DATA INQUIRY DEVICE, INQUIRY METHOD FOR PARAMETER DATA AND PROGRAM AND RECORDING MEDIUM FOR THE SAME
Document Type and Number:
Japanese Patent JP2002222222
Kind Code:
A
Abstract:
To provide a system capable of easily retrieving size information or the like on a CAD drawing and referring to it.
This system has a memory unit storing parameter data for generating a drawing for a CAD system in association with classification data of a product, a retrieval means retrieving the parameter data of the memory unit on the basis of the classification data of a product received via a network, and a transmitting means transmitting the parameter data which is the retrieval result of the retrieval means via the network.
Inventors:
KISHIMOTO KAZUYA
Application Number:
JP2001019042A
Publication Date:
August 09, 2002
Filing Date:
January 26, 2001
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G06F17/50; (IPC1-7): G06F17/50
Attorney, Agent or Firm:
Masanori Ueyanagi (1 outside)