Title:
粒子分析装置とその粒子分画方法
Document Type and Number:
Japanese Patent JP4708605
Kind Code:
B2
Abstract:
A particle analyzer includes a detecting section for detecting at least two kinds of parameters from a plurality of particles included in a sample, the two kinds of parameters representing characteristics of each particle, a processing section for processing the parameters detected by the detecting section; and an output section for outputting a result processed by the processing section, wherein the processing section includes a distribution chart creating section for creating a scattergram of the particles based on the detected parameters, a region presetting section for presetting a particle distribution region in the created scattergram, and a classifying section for calculating a classifying line corresponding to a particle distribution state in the preset particle distribution region and for classifying the particles on the scattergram by the calculated classifying line.
Inventors:
Takamichi Naito
Application Number:
JP2001194838A
Publication Date:
June 22, 2011
Filing Date:
June 27, 2001
Export Citation:
Assignee:
Sysmex Corporation
International Classes:
G01N15/14; G01N33/49; G01N33/48
Domestic Patent References:
| JP9218147A | ||||
| JP61071337A | ||||
| JP5149863A | ||||
| JP1308964A | ||||
| JP10090156A |
Attorney, Agent or Firm:
Shintaro Nogawa