Title:
PARTICLE ANALYZING DEVICE AND PARTICLE ANALYZING METHOD
Document Type and Number:
Japanese Patent JP2016095221
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a particle analyzing device that reduces noise on a signal obtained on the basis of light emitted from particles that went through light irradiation.SOLUTION: A particle analyzing device includes: a first irradiation unit for irradiating first light to particles passing through a channel at a first position on the channel; a second irradiation unit for irradiating second light to the particles at a second position downstream of the first position; a light detection unit for obtaining an optical signal emitted by the particles and outputting a voltage signal; and a signal processing unit for determining an acquisition point on the basis of the time axis of a second voltage signal output by the light detection unit on the basis of the second light irradiation by the second irradiation unit on the basis of a first voltage signal output on the basis of the first light irradiation by the first irradiation unit and flow rate of the particles.SELECTED DRAWING: Figure 2
Inventors:
TAWARA KATSUTOSHI
Application Number:
JP2014231291A
Publication Date:
May 26, 2016
Filing Date:
November 14, 2014
Export Citation:
Assignee:
SONY CORP
International Classes:
G01N15/14
Attorney, Agent or Firm:
Kaoru Watanabe