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Title:
粒子ビーム色収差補償コラム
Document Type and Number:
Japanese Patent JP3844253
Kind Code:
B2
Abstract:
A particle-beam column comprising a needle-type ions source (1) such as a liquid metal ion source, one or more round lenses (2), and a plurality of interleaved quadrupole lenses (14, 16). Also an ion-beam column comprising a liquid alloy ion source (1), interleaved quadrupole lenses (14, 16), and a Wien velocity filter (22). Such columns produce a more finely focused beam than columns based only on electrostatic lenses, and allow increased lens apertures and larger beam currents.

Inventors:
Martin, Frederick Wight
Application Number:
JP51678996A
Publication Date:
November 08, 2006
Filing Date:
November 18, 1994
Export Citation:
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Assignee:
Martin, Frederick Wight
International Classes:
H01J37/145; A61M1/14; G21K1/08; H01J3/12; H01J3/26; H01J23/08; H01J29/58; H01J37/153
Domestic Patent References:
JP3173424A
JP6068833A
JP4233145A
JP5258703A
JP6176722A
JP54100665A
JP2230647A
JP61118954A
Other References:
L.R.Harriott, W.L.Brown, D.L.Barr, Achromatic quadrupole focusing systems for use with liquid metal ion sources, Journal of Vacuum Science & Technology B, Vol.8, No.6 Nov/Dec 1990, pp.1706-1710